Prof. Johan DEBAYLE, IET Fellow, IACSIT Fellow, IEEE Senior Member Ecole Nationale Supérieure des Mines de Saint-Etienne (ENSM-SE), France
Prof. Johan DEBAYLE, IET Fellow, IACSIT Fellow, IEEE Senior Member Ecole Nationale Supérieure des Mines de Saint-Etienne (ENSM-SE), France

Home

304220830110253858.jpg

Prof.  Johan DEBAYLE, IET Fellow, IACSIT Fellow, IEEE Senior Member

Ecole Nationale Supérieure des Mines de Saint-Etienne (ENSM-SE), France


Biography: Johan Debayle received his M.Sc., Ph.D. and Habilitation degrees in the field of image processing and analysis,  in 2002, 2005 and 2012 respectively. Currently, he is a Full Professor at the Ecole Nationale Supérieure des  Mines de Saint-Etienne (MINES Saint-Etienne) in France, within the SPIN Center and the LGF Laboratory, UMR CNRS 5307, where he leads the PMDM Department interested in image analysis of granular media. He is  also the Deputy Director of the MORPHEA CNRS GDR 2021 Research Group. He is the Head of the Master of  Science in Mathematical Imaging and Spatial Pattern Analysis (MISPA) at MINES Saint-Etienne. His research interests include image processing and analysis, pattern recognition and stochastic geometry. 

He published more than 170 international papers in international journals and conference proceedings. He has been  invited to give a keynote talk in several international conferences (SPIE ICMV, IEEE ISIVC, SPIE-IS&T EI,  SPIE DCS, ICST, CIMA, ICPRS…).  He is the General Chair/Co-Chair of the international conferences ISIVC’2020, ICIVP’2021, ICMV’2021,  ECSIA’2021, ISIVC’2022, ICPRS’2022 and served as Program committee member in several international  conferences (IEEE ICIP, MICCAI, ICIAR…). 

He is Associate Editor for 7 international journals: Pattern  Recognition Letters (PRL), Pattern Analysis and Applications (Springer), Journal of Electronic Imaging (SPIE),  Journal of Imaging (MDPI), IET Image Processing (IET-Wiley), Springer Nature Computer Science (SN-CS) and Image Analysis and Stereology (ISSIA). He is a Fellow of the Institution of Engineering and Technology (IET), Fellow of the International Association  for Computer Science and Information Technology, Member of the International Society for Optics and  Photonics (SPIE), International Association for Pattern Recognition (IAPR), International Society for Stereology  and Image Analysis (ISSIA), Senior Member of the Institute of Electrical and Electronics Engineers (IEEE) and  Vice-Chair Membership of IEEE France Section.